Difference between revisions of "Documentation/Nightly/Extensions/IASEM"
From Slicer Wiki
Line 38: | Line 38: | ||
IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM). | IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM). | ||
+ | |||
+ | <gallery widths="200px" perrow="4"> | ||
+ | Image:IASEM-Screenshot1.png|Segmentation of Gold particles. | ||
+ | </gallery> | ||
<!-- ---------------------------- --> | <!-- ---------------------------- --> | ||
Line 50: | Line 54: | ||
{{documentation/{{documentation/version}}/extension-section|Use Cases}} | {{documentation/{{documentation/version}}/extension-section|Use Cases}} | ||
− | |||
− | |||
<!-- ---------------------------- --> | <!-- ---------------------------- --> |
Revision as of 12:26, 4 August 2013
Home < Documentation < Nightly < Extensions < IASEM
For the latest Slicer documentation, visit the read-the-docs. |
WARNING: This module is Work in Progress, which means:
|
Introduction and Acknowledgements
Acknowledgments:
This work is supported by NLM, and the Slicer Community. | |||||
|
Extension Description
This extension is a compilation of modules which are useful for segmentation and processing of IASEM Electron Microscopy images. It adds modules which help in general with segmenting large data sets, and has components to deal with images in multi-resolutions.
IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM).
Modules
- BinShrink ImageFilter
- SpacingAwareCurvatureDiffusion Image Filter
- DoubleThreshold Editor Effect
- BinaryWatershed Editor Effect
Use Cases
Tutorials
Similar Extensions
N/A
References
Information for Developers
Section under construction. |