Difference between revisions of "Documentation/Nightly/Extensions/IASEM"

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This extension is a compilation of modules which are useful for IASEM Electron Microscopy. It add modules which help with segmenting large data sets, and has components to deal with images in multi-resolutions.
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IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM).
  
 
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{{documentation/{{documentation/version}}/extension-section|Modules}}
 
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* BinShrink ImageFilter
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* SpacingAwareCurvatureDiffusion Image Filter
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* DoubleThreshold Editor Effect
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* BinaryWatershed Editor Effect
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Revision as of 15:22, 2 August 2013

Home < Documentation < Nightly < Extensions < IASEM


For the latest Slicer documentation, visit the read-the-docs.


Introduction and Acknowledgements

Acknowledgments: This work is supported by NLM, and the Slicer Community.
Author: Bradley Lowekamp
Contact: Bradley Lowekamp <email>blowekamp@mail.nih.gov</email>
License: Apache License 2.0

The National Library of Medicine  
National Alliance for Medical Image Computing (NA-MIC)  


Extension Description

This extension is a compilation of modules which are useful for IASEM Electron Microscopy. It add modules which help with segmenting large data sets, and has components to deal with images in multi-resolutions.

IASEM stands for ion-abrasion scanning electron microscopy, some times also call dual-beam or focused ion-beam scanning electron microscopy (FIBSEM).

Modules

  • BinShrink ImageFilter
  • SpacingAwareCurvatureDiffusion Image Filter
  • DoubleThreshold Editor Effect
  • BinaryWatershed Editor Effect


Use Cases

Tutorials

Similar Extensions

N/A

References

Information for Developers